GONG, Bin; AN, Aiming. Fault Diagnosis of Analog Circuits Based on Information Fusion in the Time-Frequency Domain. Highlights in Science, Engineering and Technology, [S. l.], v. 46, p. 306–310, 2023. DOI: 10.54097/hset.v46i.7808. Disponível em: https://drpress.org/ojs/index.php/HSET/article/view/7808. Acesso em: 16 sep. 2026.