YU, Qingyuan. Comparative Analysis of Sic and Gan: Third-Generation Semiconductor Materials. Highlights in Science, Engineering and Technology, [S. l.], v. 81, p. 484–490, 2024. DOI: 10.54097/2q3qyj85. Disponível em: https://drpress.org/ojs/index.php/HSET/article/view/16381. Acesso em: 1 jun. 2026.