LIU, Xiyao. Comparative Analysis of Characteristics and Application Fields of SiC and GaN MOS Tube. Highlights in Science, Engineering and Technology, [S. l.], v. 111, p. 438–444, 2024. DOI: 10.54097/9d262220. Disponível em: https://drpress.org/ojs/index.php/HSET/article/view/24023. Acesso em: 6 sep. 2026.