YU, Xitian. Investigation of Advanced GaN and SiC Semiconductor Materials: Key Characteristics and Diverse Applications. Highlights in Science, Engineering and Technology, [S. l.], v. 5, p. 51–61, 2022. DOI: 10.54097/hset.v5i.723. Disponível em: https://drpress.org/ojs/index.php/HSET/article/view/723. Acesso em: 10 aug. 2026.