WANG, Xiaoyin. AI-Driven Hardware Testing: Overcoming the Challenges of Modern Hardware Architecture and Power Management. Academic Journal of Science and Technology, [S. l.], v. 12, n. 3, p. 192–193, 2024. DOI: 10.54097/2wxmdf34. Disponível em: https://drpress.org/ojs/index.php/ajst/article/view/26215. Acesso em: 3 aug. 2026.