Long, Yan, Zhiang Li, Yinan Cai, Rongwei Zhang, and Ke Shen. “PCB Defect Detection Algorithm Based on Improved YOLOv8”. Academic Journal of Science and Technology 7, no. 3 (October 29, 2023): 297–304. Accessed June 8, 2026. https://drpress.org/ojs/index.php/ajst/article/view/13420.