DAI, Liangliang; WANG, Bowen; GONG, Bin. A Systematic Benchmark of Attention Mechanisms on the NEU-DET Strip Surface Defect Dataset Using YOLOv11n. Frontiers in Computing and Intelligent Systems, [S. l.], v. 17, n. 1, p. 1–8, 2026. DOI: 10.54097/k1e0ew07. Disponível em: https://drpress.org/ojs/index.php/fcis/article/view/35065. Acesso em: 10 jul. 2026.