LIAN, Xin; WANG, Dewen. Insulator defect detection algorithm based on improved YOLOv5. Frontiers in Computing and Intelligent Systems, [S. l.], v. 3, n. 2, p. 44–47, 2023. DOI: 10.54097/fcis.v3i2.7168. Disponível em: https://drpress.org/ojs/index.php/fcis/article/view/7168. Acesso em: 28 jun. 2026.