HAO, Jingbo; LI, Junfeng; DU, Yang; CHEN, Qian; LIANG, Zhen. Deep Learning Model Fused with Attention Mechanism for Defect Detection of Electroplated NdFeB Products. Frontiers in Computing and Intelligent Systems, [S. l.], v. 16, n. 2, p. 104–107, 2026. DOI: 10.54097/gw3ym444. Disponível em: https://drpress.org/ojs/index.php/fcis/article/view/34894. Acesso em: 30 may. 2026.