Hao J, Li J, Du Y, Chen Q, Liang Z. Deep Learning Model Fused with Attention Mechanism for Defect Detection of Electroplated NdFeB Products. FCIS [Internet]. 2026 Apr. 30 [cited 2026 May 30];16(2):104-7. Available from: https://drpress.org/ojs/index.php/fcis/article/view/34894