A Programmatic Summary of Theoretical Basis and Methods of Micro-resistance Measurement

Authors

  • Shiyu Zhang

DOI:

https://doi.org/10.54097/uo6c3w7y

Keywords:

Multiple Regression, Least Square Principle, Error Calculation, Four-wire Resistance Measurement

Abstract

The accuracy of micro-resistance measurements is an issue of widespread concern in industry. In this paper, we review the methods and main mathematical methods of tiny resistance measurement, firstly, we introduce the three basic mathematical knowledge of multiple regression model, the principle of least squares and the calculation of error, then we review the two-wire resistance measurement method and four-wire resistance measurement method. This paper presents a systematic description of the methods and mathematical theories related to the measurement and fitting of tiny resistors to provide a theoretical summary for future research in the area of tiny resistors.

References

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Zhu J., Li Y., Numerical Computing Methods[J], Higher Education Press, 2021: 6-7, 4-5.

Schagrin M L. Resistance to Ohm's law[J]. American Journal of Physics, 1963, 31(7): 536-547.

Janesch J. Two-wire vs. four-wire resistance measurements: Which configuration makes sense for your application[J]. no. May, 2013: 2-4.

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Published

24-12-2023

Issue

Section

Articles

How to Cite

Zhang, S. (2023). A Programmatic Summary of Theoretical Basis and Methods of Micro-resistance Measurement. Journal of Computing and Electronic Information Management, 11(3), 77-79. https://doi.org/10.54097/uo6c3w7y

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