LUO, Yiyang. Forecast and Analysis of the Fifth Trading Day Yield based on the Last 35 Trading days-Based on Long Short-Term Memory Methord. Journal of Innovation and Development, [S. l.], v. 15, n. 2, p. 80–88, 2026. DOI: 10.54097/623d4z05. Disponível em: https://drpress.org/ojs/index.php/jid/article/view/34668. Acesso em: 30 may. 2026.