HU, Duo. Optimization of Electronic Product Inspection and Defective Product Handling. Mathematical Modeling and Algorithm Application, [S. l.], v. 5, n. 3, p. 19–22, 2025. DOI: 10.54097/rb2zr683. Disponível em: https://drpress.org/ojs/index.php/mmaa/article/view/31685. Acesso em: 18 apr. 2026.