LIN, Daitong. Study on Epitaxial Layer Thickness Measurement Based on Infrared Interferometry Combined with Machine Algorithm. Mathematical Modeling and Algorithm Application, [S. l.], v. 7, n. 3, p. 4–13, 2025. DOI: 10.54097/q8jd6613. Disponível em: https://drpress.org/ojs/index.php/mmaa/article/view/33230. Acesso em: 11 aug. 2026.