LIN, Xu. Research on Radiation Effects of CMOS Image Sensors. Academic Journal of Science and Technology, [S. l.], v. 20, n. 2, p. 23–29, 2026. DOI: 10.54097/4zrmkw77. Disponível em: https://drpress.org/ojs/index.php/ajst/article/view/34030. Acesso em: 2 may. 2026.