DUAN, Yicheng. Impact of Power, EMI, and SET on VLSI NOR Circuits with Collaborative Hardening Approaches. Academic Journal of Science and Technology, [S. l.], v. 20, n. 2, p. 51–57, 2026. DOI: 10.54097/t4w2gn62. Disponível em: https://drpress.org/ojs/index.php/ajst/article/view/34035. Acesso em: 30 apr. 2026.