HUANG, Qi. Research on Power Consumption and Reliability of Digital Circuits Based on CMOS Electrical Characteristics. Academic Journal of Science and Technology, [S. l.], v. 20, n. 2, p. 58–64, 2026. DOI: 10.54097/48q95e16. Disponível em: https://drpress.org/ojs/index.php/ajst/article/view/34036. Acesso em: 30 apr. 2026.