LU, Yizhe. Acceleration Of Chip Verification Process and Defect Prediction Based on Artificial Intelligence. Frontiers in Computing and Intelligent Systems, [S. l.], v. 16, n. 1, p. 153–157, 2026. DOI: 10.54097/eqevth05. Disponível em: https://drpress.org/ojs/index.php/fcis/article/view/34410. Acesso em: 1 may. 2026.