A Complex Analog Circuit Fault Diagnosis Method based on IMODA Improved Deep Belief Network
DOI:
https://doi.org/10.54097/1s651e97Keywords:
Analog Circuit; MODA; Deep Belief Network; Fault Diagnosis.Abstract
Aiming at the problems of time-consuming and low diagnosis accuracy during the unsupervised training process of traditional DBN, an analog circuit fault diagnosis method based on Improved Multi-Objective Dragonfly Optimized Deep Belief Network (IMODA-ADBN) is proposed. The method employs an improved MODA algorithm instead of the BP algorithm, which improves the classification accuracy of the network and ameliorates the problem of being prone to falling into local optima. The algorithm is tested on three multi-objective mathematical benchmark problems and compared with three well-known meta-heuristic optimization algorithms such as MODA, MOPSO and NSGA-II, and the results demonstrate the stability of the IMODA-ADBN network model. Finally, IMODA-ADBN is applied to the diagnostic experiments of a two-stage quad op-amp dual second-order low-pass filter, and the results show that the method improves the classification accuracy and diagnostic rate while guaranteeing the convergence speed, and is able to effectively realize the classification and localization of difficult faults.
Downloads
References
Sai Sarathi Vasan Arvind, Long Bing, Pecht Michael. Diagnostics and Prognostics Method for Analog Electronic Circuits. IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, 2013, 60(11): 5277-5291.
Ao Yongcai, Shi Yibing, Zhang Wei, et al. An approximate calculation of ratio of normal variables and its application in analog circuit fault diagnosis. Journal of Electronic Testing Theory & Applications, 2013, 29 (4): 555-565.
Tang Xiaofeng, XU Aiqiang. Practical analog circuit diagnosis based on fault features with minimum ambiguities. Journal of Electronic Testing, 2016, 32(1): 1-13.
Tadeusiewicz Michal, Halgas Stanislaw. A method for local parametric fault diagnosis of a broad class of analog integrated circuits. IEEE Transactions on Instrumentation and Measurement, 2018, 67 (2): 328-337.
Aminian Mehran, Aminian Farzan. A modular fault-diagnostic system for analog electronic circuits using neural networks with wavelet transform as a preprocessor. IEEE Transactions on Instrumentation and Measurement, 2007, 56(5): 1546-1554.
Laurain Vincent, Tóth Roland, Piga Dario, et al. An instrumental least squares support vector machine for nonlinear system identification. Automatica, 2015, 54: 340-347.
Hu Qinlei, Xiao Bing. Adaptive fault tolerant control using integral sliding mode strategy with application to flexible spacecraft. International Journal of Systems Science, 2013, 44 (12): 2273-2286.
Cohen Achraf, Tiplica Teodor, Kobi A, Abdessamad. Design of experiments and statistical process control using wavelets analysis. Control Engineering Practice, 2016, 49(4): 129-138.
Tadeusiewicz Michal, Halgas Stanislaw. A new approach to multiple soft fault diagnosis of analog BJT and CMOS circuits. IEEE Transactions on Instrumentation and Measurement, 2015, 64(10): 2688-2695.
Long Bing, Li Min, WANG Houiun, et al. Diagnostics of analog circuits based on LS-SVM using time-domain features. Circuits Systems & Signal Processing, 2013, 32(6): 2683-2706.
Varatharaj Kalpana, Maheswar, R., Nandakumar, E. Multiple parametric fault diagnosis using computational intelligence techniques in linear filter circuit[J]. Journal of Ambient Intelligence and Humanized Computing, 2020, 11(2): 5533-5545.
Long Bing, Li Min, Wang Houjun, et al. Diagnostics of analog circuits based on LS-SVM using time-domain features. Circuits Systems & Signal Processing, 2013, 32(6): 2683-2706.
Long Bing, Xian Weiming, Li Min, et al. Improved diagnostics for the incipient faults in analog circuits using LSSVM based on PSO algorithm with mahalanobis distance. Neurocomputing, 2014, 133: 237-248.
Guo Xiaojie, Chen Liang, Shen Changqing. Hierarchical adaptive deep convolution neural network and its application to bearing fault diagnosis. Measurement, 2016, 93: 490-502.
Shao Haidong, Jiang Hongkai, Wang Fuan, et al. Rolling bearing fault diagnosis using adaptive deep belief network with dual-tree complex wavelet packet. ISA Transactions, 2017, 69: 187-201.
Fang Fen, Li Liyuan, Gu Ying, et al. A novel hybrid approach for crack detection. Pattern Recognition, 2020, 107: 107474.
Zhao Guangquan, Liu Xiaoyong, Zhang Bin, et al. A novel approach for analog circuit fault diagnosis based on deep belief network. Measurement, 2018, 121: 170-178.
Liu Zhenbao, Jia Zhen, Vong Chi-Man, et al. Capturing high-discriminative fault features for electronics-rich analog system via deep learning. IEEE Transactions on Industrial Informatics, 2017, 1(3): 1213-1226.
Coello Carlos A. coello, Pulido Gregorio Toscano, Lechuga Maximino Salazar. Handling multiple objectives with particle swarm optimization[J]. IEEE Trans Evolutionary Computation. 2004, 8(3): 256-279.
Downloads
Published
Issue
Section
License
Copyright (c) 2024 Academic Journal of Science and Technology

This work is licensed under a Creative Commons Attribution 4.0 International License.








