Research on Synchronous Acquisition and Processing Technology of Arc During Breaking Tests of Low-Voltage Electrical Devices

An Zu; Hongkui Zhang

doi:10.54097/4a0fma24

Authors

An Zu
Hongkui Zhang

DOI:

https://doi.org/10.54097/4a0fma24

Keywords:

Low-voltage electrical devices, breaking test, arc, image enhancement.

Abstract

Based on the analysis of the arc generation mechanism in low-voltage electrical devices, a synchronous acquisition system for arc during breaking tests of low-voltage electrical equipment has been designed. A wavelet analysis-based method for enhancing arc images has been proposed to improve the accuracy of arc image acquisition and recognition, providing a reference for the development of breaking test technology for low-voltage electrical devices.

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References

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