Research on Parallel Testing Technology of MCU Chips Based on ATE

Abstract

Micro - control units (MCUs) are extensively applied across various domains such as automotive electronics, smart homes, and communication equipment. Their testing technology stands as a pivotal element in guaranteeing product quality. Conventional MCU chip testing predominantly utilizes a serial testing mode, which is plagued by issues like lengthy testing duration and low efficiency, rendering it incapable of satisfying the rapid testing demands of large - scale production lines. This paper delves into the parallel testing technology of MCU chips based on Automatic Test Equipment (ATE). By refining the testing scheme, it enhances test parallelism to ensure testing efficiency and diminish testing costs. This study also scrutinizes the fundamental testing requirements of MCU chips and elaborates on the implementation methodology of parallel testing technology based on ATE. It posits that parallel testing technology can substantially curtail testing time, amplify testing throughput, ensure the accuracy and reliability of testing outcomes, and offers a novel solution for large - scale MCU chip testing.