Key Metrology Requirements and Industrial Benefit Assessment for the 6G Communication Era

Authors

  • Huiyuan Geng Beijing Institute of Technology, Beijing 102401, China
  • Xuan Xu National Institute of Metrology, Beijing 100029, China

DOI:

https://doi.org/10.54097/zvvgzg05

Keywords:

6G Communication, Terahertz, Communication Metrology, Industrial Benefits, Metrological Traceability.

Abstract

As research into 6G enters a critical window, Terahertz (THz) communication has emerged as a core enabling technology for the 6G physical layer, owing to its immense bandwidth and potential for integrated sensing and communication. However, the extreme frequency band introduces significant challenges for the existing metrological framework, including device non-linearity, near-field propagation effects, and measurement uncertainty in ultra-wideband signals. From the perspective of national metrological infrastructure supporting industrial development, this paper systematically explores the key metrology requirements for 6G THz communication across device characterization, spatial propagation, and system integration. Furthermore, it provides a quantitative assessment of the economic value that precise metrology contributes to shortening R&D cycles, enhancing manufacturing yields, and optimizing deployment costs. The research demonstrates that establishing a standardized and traceable 6G communication metrology system is a strategic cornerstone for overcoming commercialization bottlenecks, dismantling technical trade barriers, and achieving high-quality industrial development.

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References

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[4] Wang, K. H., Li, X. Y., Kong, M., et al. (2018). Probabilistically shaped 16QAM signal transmission in a photonics-aided wireless terahertz-wave system. In 2018 Optical Fiber Communications Conference and Exposition (OFC) (pp. 1–3). IEEE.

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Published

30-06-2026

Issue

Section

Articles

How to Cite

Geng, H., & Xu, X. (2026). Key Metrology Requirements and Industrial Benefit Assessment for the 6G Communication Era. Frontiers in Computing and Intelligent Systems, 16(3), 77-81. https://doi.org/10.54097/zvvgzg05